Tilrådd term
Focused Ion beam lithography
Definisjon
Beskriving og avgrensing av omfanget til omgrepet.- 1. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). (Wikipedia). 2. Focused Ion Beams (FIB) enable precise material removal and modification at the nanoscale, vital for device fabrication and nanofabrication. (https://raith.com/products/focused-ion-beams/).
Overordna omgrep
Overordna omgrepPå andre språk
Termar brukt om det same omgrepet på andre språk.- Focused Ion beam lithography
engelsk
URI
https://purls.helmholtz-metadaten.de/skosmos/sdv/FocusedIonBeamLithography