Voorkeursterm
Focused Ion beam lithography
Definitie
Een complete uitleg over de bedoelde betekenis van een concept- 1. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). (Wikipedia). 2. Focused Ion Beams (FIB) enable precise material removal and modification at the nanoscale, vital for device fabrication and nanofabrication. (https://raith.com/products/focused-ion-beams/).
Breder concept
Breder conceptIn andere talen
Termen voor het concept in andere talen.- Focused Ion beam lithography
Engels
URI
https://purls.helmholtz-metadaten.de/skosmos/sdv/FocusedIonBeamLithography