اصطلاح مرجح
Focused Ion beam lithography
تعریف
توضیح کامل برای معنی بار شده به یک مفهوم- 1. Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials. A FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). (Wikipedia). 2. Focused Ion Beams (FIB) enable precise material removal and modification at the nanoscale, vital for device fabrication and nanofabrication. (https://raith.com/products/focused-ion-beams/).
مفهوم اعم
مفهوم اعمدر زبان های دیگر
اصطلاحها در زبانهای دیگر برای این مفهوم- Focused Ion beam lithography
URI
https://purls.helmholtz-metadaten.de/skosmos/sdv/FocusedIonBeamLithography