Ir para o conteúdo principal

sampleDescription

Pesquisar no vocabulário

Língua do conteúdo

Informação do conceito

Preparation action > Mechanical and surface > Mechanical and surface method > Focused ion beam
Material description > Material treatment > Mechanical and surface > Mechanical and surface method > Focused ion beam

Termo preferencial

Focused ion beam  

Definição

  • An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the sample. (TIB, NCI Thesaurus OBO Edition)

Conceito superordenado

URI

https://purls.helmholtz-metadaten.de/evoks/sdv/focusIonBeam

Descarregar este conceito:

RDF/XML TURTLE JSON-LD