Hyppää sisältöön

sampleDescription

Sisällön kieli

Preparation action > Mechanical and surface > Mechanical and surface method > Focused ion beam

Material description > Material treatment > Mechanical and surface > Mechanical and surface method > Focused ion beam

Käytettävä termi

Focused ion beam

An instrument that combines the use of a focused beam of gallium ions to etch or coat a sample with a scanning electron microscope to image the sample. (TIB, NCI Thesaurus OBO Edition)

Mechanical and surface method

URI

https://purls.helmholtz-metadaten.de/evoks/sdv/focusIonBeam

Lataa tämä käsite:

RDF/XML TURTLE JSON-LD